Applied logistic regression / David W. Hosmer, Jr., Stanley Lemeshow.

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Material type: Text

TextSeries: Wiley series in probability and mathematical statistics. Applied probability and statisticsPublication details: New York : Wiley, c1989.Description: xiii, 307 p. ; 24 cmISBN:

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Item type	Current library	Collection	Call number	Copy number	Status	Barcode
Books like text book referance book	Wondo Genet Library General Stacks	Reference	519.5/36 HOS 1989 (Browse shelf(Opens below))	1	Available	WGCFNRL00010052

"A Wiley-Interscience publication."

Includes bibliographical references (p. 291-300) and index.

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