Hosmer, David W. <br/><br/>
Applied logistic regression / 
David W. Hosmer, Jr., Stanley Lemeshow. 
 - New York :  Wiley,  c1989. 
 - xiii, 307 p. ;  24 cm. 
 - Wiley series in probability and mathematical statistics.  Applied probability and statistics .
<br/><br/> "A Wiley-Interscience publication." 
<br/><br/>Includes bibliographical references (p. 291-300) and index. 
<br/><br/><label>ISBN: </label>0471615536 
<br/><br/><label>LCCN: </label>89031893  
<br/><br/><label>Subjects--Topical Terms: </label><br/>Regression analysis.
<br/><br/><label>LC Class. No.: </label>QA278.2  / .H67 1989 
<br/><br/><label>Dewey Class. No.: </label>519.5/36 HOS 1989